Dishing prevention dummy structures for semiconductor devices

ABSTRACT

In some embodiments, an integrated circuit is provided. The integrated circuit may include an inner ring-shaped isolation structure that is disposed in a semiconductor substrate. Further, the inner-ring shaped isolation structure may demarcate a device region. An inner ring-shaped well is disposed in the semiconductor substrate and surrounds the inner ring-shaped isolation structure. A plurality of dummy gates are arranged over the inner ring-shaped well. Moreover, the plurality of dummy gates are arranged within an interlayer dielectric layer.

REFERENCE TO RELATED APPLICATIONS

This Application is a Continuation of U.S. application Ser. No.15/964,572, filed on Apr. 27, 2018, which claims the benefit of U.S.Provisional Application No. 62/562,564, filed on Sep. 25, 2017. Thecontents of the above-referenced Patent Applications are herebyincorporated by reference in their entirety.

BACKGROUND

Integrated chips comprise millions or billions of transistor devices.Modern day integrated chips generally comprise a variety of transistorsthat are capable of operating a different voltages. High voltage devicesare widely used in power management, regulators, battery protectors, DCmotors, automotive circuits, panel display drivers, etc. On the otherhand, low voltage devices are typically used for logic cores,microprocessors, and microcontrollers. Some modern integrated circuit(IC) designs integrate both high voltage and low voltage devices on asingle chip. In both high voltage and low voltage technologies,functional density (e.g., the number of devices per chip area) hasgenerally increased while feature size (e.g., the smallest component (orline) that can be created using a fabrication process) has decreased.However, the increase in functional density and decrease in feature sizehas caused both low voltage and high voltage devices to suffer leakageand other undesirable dimensional based effects.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 illustrates a top view of some embodiments of an integratedcircuit comprising first and second IC regions having dishing preventiondummy gates.

FIG. 2 illustrates a cross-sectional view of some embodiments of anintegrated circuit comprising first and second IC regions having dishingprevention dummy gates.

FIG. 3A illustrates a cross-sectional view of some more detailedembodiments of an integrated circuit comprising first and second ICregions having dishing prevention dummy gates.

FIG. 3B illustrates a cross-sectional view of some embodiments of anintegrated circuit comprising a first IC region having dishingprevention dummy gates and a second IC region having dishing preventiondummy gates disposed proximate a third device region.

FIGS. 4-19 illustrate a series of cross-sectional views of someembodiments of a method for forming an integrated circuit comprisingfirst and second IC regions having dishing prevention dummy gates.

FIG. 20 illustrates a flowchart of some embodiments of the method forforming an integrated circuit comprising first and second IC regionshaving dishing prevention dummy gates.

DETAILED DESCRIPTION

The present disclosure provides many different embodiments, or examples,for implementing different features of this disclosure. Specificexamples of components and arrangements are described below to simplifythe present disclosure. These are, of course, merely examples and arenot intended to be limiting. For example, the formation of a firstfeature over or on a second feature in the description that follows mayinclude embodiments in which the first and second features are formed indirect contact, and may also include embodiments in which additionalfeatures may be formed between the first and second features, such thatthe first and second features may not be in direct contact. In addition,the present disclosure may repeat reference numerals and/or letters inthe various examples. This repetition is for the purpose of simplicityand clarity and does not in itself dictate a relationship between thevarious embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper”, and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice or apparatus in use or operation in addition to the orientationdepicted in the figures. The device or apparatus may be otherwiseoriented (rotated 90 degrees or at other orientations) and the spatiallyrelative descriptors used herein may likewise be interpretedaccordingly. Even more, the terms “first”, “second”, “third”, “fourth”,and the like are merely generic identifiers and, as such, may beinterchanged in various embodiments. For example, while an element(e.g., an etch, a dielectric layer, or a substrate) may be referred toas a “first” element in some embodiments, the element may be referred toas a “second” element in other embodiments.

As the feature size of integrated chip devices has decreased, electricalisolation between adjacent devices has become more difficult. Generally,electrical isolation is achieved by way of isolation structures disposedwithin a substrate. For example, isolation between adjacent devices canbe achieved by way of shallow trench isolation (STI) structures and/orby guard rings. While, such structures generally provide for goodelectrical isolation between adjacent devices, other leakage paths alsoexist.

For example, during the fabrication of semiconductor devices,chemical-mechanical planarization (CMP) processes are widely used toform planar surfaces. When CMP processes are performed on interfaceshaving different materials, the different materials may be removed atdifferent rates. The removal of different materials at different rateswill result in some areas of the interface being recessed relative toother areas, an effect commonly known as “dishing.” When a CMP processis performed on a dielectric layer that is disposed over a first andsecond plurality of devices, the CMP process will remove portions of thedielectric layer, for example, to expose underlying features of thedevices (e.g., a sacrificial gate) for subsequent processing (e.g.,etching for a replacement poly-gate (RPG) process) and/or provide auniform height for the underlying features (e.g., to form a uniformmetal gate height) of the devices and the dielectric layer.

However, due to the process parameters of the CMP process(es) (e.g.,chemical slurry composition, pressure, velocity, time, etc.) and thevarious types of materials disposed within the dielectric layer (e.g.,dielectric, metal, polysilicon, etc.), the CMP process(es) may causedishing in the dielectric layer (as the various materials are removed atdifferent rates during the CMP process) between adjacent devices. Duringa subsequent metallization process (e.g., replacing polysilicon gateswith a conductive material), the lower regions of the dielectric layermay be filled with a conductive metal, resulting in leakage pathsbetween the adjacent devices. In the case of high voltage devices, thisproblem can be aggravated due to dielectric breakdown caused by the highvoltages of the devices. In some severe instances, the dishing may causeimproperly functioning devices.

The present disclosure pertains to an integrated circuit having a firstIC region and a second IC region. The first IC region comprises a firstdevice region (e.g., a low voltage region) that has a plurality of firstdevices. The second IC region comprises a second device region (e.g., amid voltage region) that has a plurality of second devices. The first ICregion has a first inner ring-shaped well (i.e., a first guard ring)that surrounds the first device region and a first outer ring-shapedwell that surrounds the first inner ring-shaped well. The second ICregion has a second inner ring-shaped well (i.e., a second guard ring)that surround the second device region and a second outer ring-shapedwell that surrounds the second inner ring-shaped well. A plurality ofdishing prevention dummy gates are disposed within a dielectric layerover an upper surface of both the first IC region and the second ICregion. The dishing prevention dummy gates provide structural supportduring fabrication of the IC to mitigate the amount of dishing of thedielectric layer. Accordingly, the performance of the underlying devicesmay be improved and the cost of manufacturing ICs may be reduced.

FIG. 1 illustrates a top view of some embodiments of an integratedcircuit 100 comprising a first IC region having dishing prevention dummygates and a second IC region having dishing prevention dummy gates.

The integrated circuit (IC) 100 has a first IC region 112 a having afirst device region 102 a and a second IC region 112 b having a seconddevice region 102 b. In some embodiments, the first device region 102 acomprises a plurality of first devices 104 a, and the second deviceregion 102 b comprises a plurality of second devices 104 b. In someembodiments, the first devices 104 a and the second devices 104 b may below voltage devices (e.g., operating voltage of approximately 1.2 eV),mid-voltage devices (e.g., operating voltage of approximately 6.0 eV),or high voltage devices (e.g., operating voltage of approximately 1,000eV). In yet further embodiments, the first device region 102 a maycomprise one type of devices (e.g., low voltage, mid-voltage, or highvoltage) and the second device region 102 b may comprise one type ofdevice. The low voltage, mid-voltage, or high voltage devices may be forexample, metal-oxide-semiconductor field effect transistors (MOSFETs),complementary MOS (CMOS) transistors, laterally diffused MOS (LDMOS)transistors, high power MOS transistors, FinFET, and/or other types ofdevices.

The first device region 102 a is surrounded by a first inner ring-shapedwell 106 a. The first inner ring-shaped well 106 a is disposed within anunderlying semiconductor substrate and comprises a first doping type(e.g., n-type). The first inner ring-shaped well 106 a is separated fromthe first device region 102 a by a first inner isolation structure 107 a(e.g., a shallow trench isolation (STI)). The first inner ring-shapedwell 106 a comprises a first inner highly doped region 111 a (e.g., n+)having the first doping type and is disposed between the first innerisolation structure 107 a and a first outer isolation structure 109 a.In some embodiments, a contact (not shown) is coupled to the first innerhighly doped region 111 a of the first inner ring-shaped well 106 a andis configured to provide a first electric potential (e.g., a lowrelative voltage or a high relative voltage). Accordingly, the firstinner ring-shaped well 106 a may act as a protection element (i.e., afirst guard ring) for devices disposed on the IC 100 by collectingunwanted electrical signals that may propagate in/out of the firstdevice region 102 a and disrupt (e.g., latch-up, unwanted activation,etc.) the function of the devices disposed on the IC.

In some embodiments, the first inner ring-shaped well 106 a has a firstinner ring-shaped well thickness, t₁, which defines a width of the firstinner ring-shaped well 106 a and may be substantially the same atvarious points around the first device region 102 a, measured from aperimeter of the first device region 102 a to a perimeter of the firstinner ring-shaped well 106 a. The first inner ring-shaped wellthickness, t₁, may be based, at least in part, on the type of devices(e.g., low voltage, mid-voltage, or high voltage) disposed within thefirst device region 102 a.

In some embodiments, the first inner ring-shaped well 106 a issurrounded by a first outer ring-shaped well 108 a. In yet furtherembodiments, the first inner ring shaped well 106 a and the first outerring-shaped well 108 a are concentric about a first center point 110 aof the first device region 102 a. The first outer ring-shaped well 108 ais disposed within the underlying semiconductor substrate and comprisesa second doping type (e.g., p-type) that is opposite the first dopingtype. The first outer ring-shaped well 108 a is separated from the firstinner ring-shaped well 106 a by a first outer isolation structure 109 a(e.g., STI). The first outer ring-shaped well 108 a comprises a firstouter highly doped region 113 a (e.g., p+) having the second doping typeand is disposed between the first outer isolation structure 109 a andthe perimeter of the first IC region 112 a. In some embodiments, acontact (not shown) is coupled to the first outer highly doped region113 a of the first outer ring-shaped well 108 a and is configured toprovide a second electric potential opposite the first electricpotential (e.g., either a high relative voltage or a low relativevoltage). Accordingly, the first inner ring-shaped well 106 a and thefirst outer ring-shaped well 108 a act as protection elements (i.e.,guard rings) for devices disposed on the IC 100 by providing a p-njunction isolation that prevents unwanted current from flowing in/outthe first device region 102 a and disrupting the function of devicesdisposed on the IC 100.

The first outer ring-shaped well 108 a has a first outer ring-shapedwell thickness, t₂, which defines a width of the first outer ring-shapedwell 108 a and may be substantially the same at various points aroundthe first inner ring-shaped well 106 a, measured from a perimeter of thefirst inner ring-shaped well 106 a to a perimeter of the first outerring-shaped well 106 b. The first outer ring-shaped well thickness, t₂,may be based, at least in part, on the type of devices (e.g., lowvoltage, mid-voltage, or high voltage) disposed within the first deviceregion 102 a. In some embodiments, the first inner ring-shaped wellthickness, t₁, is substantially similar to the first outer ring-shapedwell thickness, t₂. In yet other embodiments, the first innerring-shaped well thickness, t₁, may be greater than the first outerring-shaped well thickness, t₂. For example, the first inner ring-shapedwell thickness, t₁, may be twice the first outer ring-shaped wellthickness, t₂.

In some embodiments, the second device region 102 b and the seconddevices 104 b are arranged in a similar manner as the first deviceregion 102 a and the first devices 104 a. For example, the second deviceregion 102 b is surrounded by a second inner ring-shaped well 106 b, andthe second inner ring-shaped well 106 b is surrounded by a second outerring-shaped well 108 b. In some embodiments, the perimeter of the secondouter ring-shaped well 108 b defines the perimeter of the second ICregion 112 b. The second inner ring-shaped well 106 b has a thickness,t₃, and the second outer ring-shaped well 108 b has a thickness, t₄.

A plurality of dishing prevention dummy gates 114 are disposed over anupper surface of the first inner ring-shaped well 106 a, the first outerring-shaped well 108 a, first inner isolation structure 107 a, and thefirst outer isolation structure 109 a. In some embodiments, theplurality of dishing prevention dummy gates 114 are disposed partiallyover or completely over the upper surface of the first inner ring-shapedwell 106 a, the first outer ring-shaped well 108 a, first innerisolation structure 107 a, and the first outer isolation structure 109 ain a vertical direction. In addition, a plurality of dishing preventiondummy gates 114 are disposed over an upper surface of the second innerring-shaped well 106 b, the second outer ring-shaped well 108 b, asecond inner isolation structure 107 b, and a second outer isolationstructure 109 b. In some embodiments, the plurality of dishingprevention dummy gates 114 are disposed partially over or completelyover the upper surface of the second inner ring-shaped well 106 b, thesecond outer ring-shaped well 108 b, a second inner isolation structure107 b, and a second outer isolation structure 109 b in a verticaldirection. In further embodiments, the dishing prevention dummy gates114 comprise a conductive material (e.g., metal, polysilicon, silicide,etc.). In further embodiments, the dishing prevention dummy gates 114are electrically floating (e.g., a voltage is not applied to the dummygates 114 during operation of the integrated circuit 100).

Further, while the dishing prevention dummy gates 114 are shown asquadrilaterals, it will be appreciated that the dishing prevention dummygates 114 may have varying shapes and sizes. In some embodiments, thevarying shapes and sizes may be based, at least in part, on the type ofdevices (e.g., low voltage, mid-voltage, or high voltage) disposedwithin the first device region 102 a and/or the second device region 102b, or on the composition of the material (e.g., polysilicon, aluminum,tantalum, copper, etc.) of dishing prevention dummy gates 114. By basingthe varying shapes and sizes of the dishing prevention dummy gates 114on the foregoing properties, the dishing prevention dummy gates 114 mayprevent unwanted dishing from occurring over the first device region 102a and/or the second device region 102 b during a subsequent CMP processby acting as support pillars for a surrounding material (e.g., adielectric material disposed over the first devices 104 a disposed inthe first device region 102 a). Accordingly, by reducing the amount ofdishing, the performance of the first devices 104 a and the seconddevices 104 b may be improved and the cost of manufacturing the IC 100may be reduced.

FIG. 2 illustrates a cross-sectional view of some embodiments of anintegrated circuit 200 comprising first and second IC regions havingdishing prevention dummy gates.

The integrated circuit 200 comprises a semiconductor substrate 202including the first inner ring-shaped well 106 a, the first outerring-shaped well 108 a, the second inner ring-shaped well 106 b, and thesecond outer ring-shaped well 108 b. The semiconductor substrate 202 maycomprise any type of semiconductor body (e.g., monocrystallinesilicon/CMOS bulk, silicon-germanium (SiGe), silicon on insulator (SOI),etc.) and may be doped with the second doping type (e.g., p-type). Thefirst inner ring-shaped well 106 a may be a continuous ring-shapedregion of the semiconductor substrate 202 that surrounds the firstdevice region 102 a and comprises the first doping type (e.g., n-type).The ring-shaped region of the first inner ring-shaped well 106 a may be,for example, a circle, semi-circle, ellipse, quadrilateral, etc. In someembodiments, the first inner ring-shaped well 106 a extends below abottom surface of the first inner isolation structure 107 a. The firstinner ring-shaped well 106 a further comprises a first inner highlydoped region of the first inner highly doped region 111 a, to which acontact (not shown) may be coupled. The first inner ring-shaped well 106a is separated from the first device region 102 a by the first innerisolation structure 107 a. The first inner isolation structure 107 a maybe, for example, a circle, semi-circle, ellipse, quadrilateral, etc. Insome embodiments, the first inner isolation structure 107 a may beconcentric about the first device region 102 a.

The first device region 102 a includes a first device well 206 a. Insome embodiments, the first device well 206 a may be disposed within afirst deep well 212 a that underlies the first device well 206 a. Thefirst device well 206 a comprises a doping type (e.g., n-type or p-type)that depends on the function of the first device 104 a. In someembodiments, the first device well 206 a is separated from the firstinner ring-shaped well 106 a by the first inner isolation structure 107a. On the other hand, the first deep well 212 a may extend below thefirst device region 102 a, the first inner ring-shaped well 106 a, and aportion of the first outer isolation structure 109 a to contact thefirst outer ring-shaped well 108 a below a bottom surface of the firstouter isolation structure 109 a. The first deep well 212 a comprises thefirst doping type (e.g., n-type).

Further, a pair of source/drain regions 216 laterally spaced from oneanother are arranged in the first device well 206 a. Moreover, a pair ofsource/drain extensions 218 are laterally spaced and disposed betweenthe pair of source/drain regions 216 in the first device well 206 a. Forclarity in the figures, a single first device well region 206 a isdepicted in the first device region 102 a, and one pair of the pair ofsource/drain extension 218 is labeled. However, because the first deviceregion 102 a may comprise a plurality of first devices 104 a, the firstdevice region 102 a may comprise a plurality of first device wellregions 206 a disposed throughout the first device region 102 a eachhaving a pair of source/drain regions 216 and a pair of source/drainextensions 218, in which the doping may vary depending on the dopingtype of the first device well 206 a.

In some embodiments, the first outer ring-shaped well 108 a is acontinuous ring-shaped region of the semiconductor substrate 202 thatsurrounds the first inner ring-shaped well 106 a and comprises thesecond doping type (e.g., p-type), which is different than the firstdoping type. The ring-shaped region of the first outer ring-shaped well108 a may be, for example, a circle, semi-circle, ellipse,quadrilateral, etc. In some embodiments, the first outer ring-shapedwell 108 a extends below a bottom surface of the first outer isolationstructure 109 a and contacts a portion of the first inner ring-shapedwell 106 a. The first outer ring-shaped well 108 a further comprises afirst outer highly doped region 113 a of the first outer ring-shapedwell 108 a, in which a contact (not shown) may be coupled. The firstouter ring-shaped well 108 a is separated from the first innerring-shaped well 106 a by the first outer isolation structure 109 a. Thefirst outer isolation structure 109 a may be, for example, a circle,semi-circle, ellipse, quadrilateral, etc. In some embodiments, the firstouter isolation structure 109 a may be concentric about the first outerring-shaped well 108 a. In some embodiments, a first IC region isolationstructure 236 a (e.g., STI) is disposed on a first side of the firstouter ring-shaped well 108 a. In some embodiments, the first outerring-shaped well 108 a and the second outer ring-shaped well 108 b sharea common doping region disposed between the first IC region 112 a andthe second IC region 112 b. In such an embodiment, a mid-point of thecommon doping region may define a side of the first IC region 112 a anda side of the second IC region 112 b.

A device gate electrode 222 is disposed over the first device well 206 aand is separated from the semiconductor substrate 202 by a device gatedielectric 220. Sidewall spacers 224 are disposed along sidewalls of thedevice gate electrode 222 and the device gate dielectric 220. The devicegate electrode 222, the device gate dielectric 220, and the sidewallspacers 224 are disposed within an interlayer dielectric (ILD) layer204. The ILD layer 204 may comprise, for example, phosphosilicate glass(PSG), borophosphosilicate glass (BPSG), silicon dioxide (SiO₂), or someother suitable dielectric.

In some embodiments, the first devices 104 a may be low voltage devicesand have a low voltage gate dielectric 220, a low voltage gate electrode222, and sidewall spacers 224. On the other hand, in furtherembodiments, the second device 104 b may be a mid-voltage device havinga mid-voltage gate dielectric 226, a mid-voltage gate electrode 228, andsidewall spacers 224, a pair of source/drain regions 216 disposed in thesecond device well 206 b, a pair of source/drain extensions 218 disposedin the second device well 206 b, and the second device well 206 b. Insome embodiments, the low voltage gate electrode 222 and the mid-voltagegate electrode 228 comprise a conductive material (e.g., aluminum,copper, tantalum, or some other suitable material).

A plurality of dishing prevention dummy gates 114 are disposed withinthe ILD layer 204. The dishing prevention dummy gates 114 are arrangedover the semiconductor substrate 202 and are positioned over variousregions of the first IC region 112 a and the second IC region 112 b. Insome embodiments, dishing prevention dummy gates 114 are arranged overthe first/second inner isolation structures 107 a/107 b, thefirst/second outer isolation structures 109 a/109 b, and thefirst/second IC region isolation structures 236 a/236 b. The dishingprevention dummy gates 114 may also be arranged elsewhere in the firstIC region 112 a and the second IC region 112 b. For example, the dishingprevention dummy gates 114 may be placed over the first/second innerhighly doped region 111 a/111 b or the first/second outer highly dopedregion 113 a/113 b. By placing the dishing prevention dummy gates 114various locations across the first IC region 112 a and the second ICregion 112 b, the dishing prevention dummy gates 114 may preventunwanted dishing from occurring over the first device region 102 a andthe second device region 102 b during a subsequent CMP process by actingas support pillars for the ILD layer 204. Accordingly, by reducing theamount of dishing, the performance of the first devices 104 a and thesecond devices 104 b may be improved and the cost of manufacturing theIC 200 may be reduced.

The dishing prevention dummy gates 114 are typically incorporated intothe same processing steps that are used to form the gate stacks of thefirst device region 102 a and the second device region 102 b. Thus, insome embodiments, the dishing prevention dummy gates 114 include a dummygate dielectric 232, a dummy gate 234, and sidewall spacers 224. Thedummy gate 234 may comprises, for example, polysilicon, aluminum,copper, tantalum, or some other suitable material.

Further, to ensure uniform removal of the ILD layer 204, the dishingprevention dummy gates 114 may have similar geometrical dimensions(e.g., a similar gate electrode height/width/depth, gate oxideheight/width/depth, and/or sidewall spacer height/width/depth) as thefeatures of the devices 104 a/104 b nearest the dishing prevention dummygates 114. For example, in some embodiments, the first devices 104 a arelow voltage devices and the device gate electrode 222 may comprise metaland the device gate dielectric 220 may comprise a high-k dielectric,which may be referred to as a high-k metal gate (HKMG) devices.Accordingly, the dishing prevention dummy gates 114 proximate the HKMGdevices may have similar features and dimensions as the HKMG devices inthe first device region 102 a. On the other hand, the second devices 104b may be mid-voltage devices and the device gate electrode 222 may be afully silicided (FUSI) gate. Accordingly, the dishing prevention dummygates 114 proximate the FUSI gate devices may have similar features anddimensions as the FUSI gate devices in the second device region 102 b.In other embodiments, additional processes (e.g., photolithography,etching, anneals) may be used to form the dishing prevention dummygates, such that the features and geometries of the dishing preventiondummy gates 114 are not similar to the features of the proximatedevices.

In some embodiments, the dummy gate dielectrics 232 of the dishingprevention dummy gates 114 disposed in the first IC region 112 a have afirst dummy gate dielectric height, h₁, and the device gate dielectrics220 of the first devices 104 a have a first device gate dielectricheight, h₂. The dummy gate dielectrics 232 of the dishing preventiondummy gates 114 disposed in the second IC region 112 b have a seconddummy gate dielectric height, h₃, and the device gate dielectrics 226 ofthe second devices 104 b have a second device dielectric height, h₄. Insome embodiments, the first dummy gate dielectric height, h₁, issubstantially the same as the first device gate dielectric height, h₂,and the second dummy gate dielectric height, h₃, is substantially thesame as the second device dielectric height, h₄.

Because some of the features described above are arranged in a similarmanner in both the first IC region 112 a and the second IC region 112 b,some features are only described with reference to the first IC region112 a. However, it will be appreciated that in some embodiments thedescription of these features also pertains to similar features in thesecond IC region 112 b.

FIG. 3A illustrates a cross-sectional view of some more detailedembodiments of an integrated circuit 300A comprising first and second ICregions having dishing prevention dummy gates.

In some embodiments, the IC 300A comprises an interconnect structure 308that is arranged over the ILD layer 204. The interconnect structure 308may comprise a plurality of inter-metal dielectric (IMD) layers 310-311.In some embodiments, a first IMD layer 311 is disposed over a topsurface of the ILD layer 204. The IMD layers 310-311 may comprise, forexample, one or more layers of an oxide, a low-k dielectric, or anultra-low-k dielectric. The IMD layers 310-311 may surround contacts312, metal wires 314, and metal vias 316 that comprise, for example,copper, tungsten, and/or aluminum. For example, the contacts 312 areconfigured to electrically couple the pair of source/drain regions 216of the first devices 104 a and the second devices 104 b to a first metalwire 314 of the interconnect structure 308.

An under-bump metallization (UBM) stack 318 is arranged over theinterconnect structure 308. In some embodiments, the UBM stack 318comprises a passivation layer 320 and a UBM layer 322. In someembodiments, the passivation layer 320 comprises one or more layers ofSiO₂, silicon nitride (Si₃N₄), polyimide compounds, or other suitablematerials. The UBM layer 322 contacts an upper conductive feature (e.g.,a contact pad) of the interconnect structure 308. The UBM layer 322 maycomprise, for example, aluminum, titanium, tungsten, or some othersuitable material. The UBM layer 322 is configured to provide aninterface between an overlying solder bump (not shown) and an underlyingconductive feature (e.g., a contact pad or a conductive trace) of theinterconnect structure 308.

FIG. 3B illustrates a cross-sectional view of some embodiments of anintegrated circuit 300B comprising a first IC region having dishingprevention dummy gates and a second IC region having dishing preventiondummy gates disposed proximate a third device region.

The integrated circuit 300B comprises a third device region 324 arrangedadjacent to the second IC region 112 b. The third device region 324 maycomprise a plurality of third devices 326. In some embodiments, thefirst IC region 112 a comprises low voltage devices, the second ICregion 112 b comprises mid-voltage devices, and the third device region324 comprises high-voltage devices. In some embodiments, the thirddevice 326 comprises a high voltage n-well 328 disposed within thesemiconductor substrate 202 and arranged within a high voltage p-well330. A pair of source/drain regions 216 are also disposed within thesemiconductor substrate 202 and are arranged within the high-voltagen-well 328. A plurality of isolation structures 332 are further disposedwithin the semiconductor substrate 202 and separate various features(e.g., the pair of source/drain regions 216 from highly doped regions ofthe high voltage p-well 334) of the third device 326.

The third device 326 may further comprise a high voltage oxide layer 336that is disposed over the semiconductor substrate 202 and arrangedbetween the pair of source/drain regions 216. A high voltage gate oxidelayer 338 is arranged over the high voltage oxide layer 336 andseparates the high voltage gate 340 from the high voltage oxide layer336. In some embodiments, a pair of high voltage sidewall spacers 342are arranged along sidewalls of the high voltage gate oxide layer 338and the high voltage gate 340. The interconnect structure 308 and theUBM stack 318 are disposed over the third device region 324 toelectrically couple features (e.g., pair of source/drain regions 216,high voltage gate 340, and/or highly doped regions of the high voltagep-well 334) of the third device region 324 to an input/output structure(e.g., a solder bump). In further embodiments, the third device 326 maybe, for example, high voltage bipolar junction transistor, a verticaldiffused metal oxide semiconductor (VDMOS) device, a laterally diffusedmetal oxide semiconductor (LDMOS) device, or some other powermetal-oxide-semiconductor field-effect transistor (MOSFET).

With reference to FIGS. 4-19, a series of cross-sectional views of someembodiments of a method for forming a first IC region having dishingprevention dummy gates and a second IC region having dishing preventiondummy gates is provided.

As illustrated by FIG. 4, a first deep well region 212 a, a second deepwell region 212 b, a first inner isolation structure 107 a, a secondinner isolation structure 107 b, a first outer isolation structure 109a, a second outer isolation structure 109 b, a first IC region isolationstructure 236 a, and a second IC region isolation structure 236 b(collectively “isolation structures 107 a/107 b/109 a/109 b/236 a/236b”) are formed in the semiconductor substrate 202. In some embodiments,prior to forming the isolation structures 107 a/107 b/109 a/109 b/236a/236 b, the first deep well region 212 a and the second deep wellregion 212 b are formed in the semiconductor substrate 202. The firstdeep well region 212 a and the second deep well region 212 b have afirst doping type (e.g., p-type) and may, for example, be formed by ionimplantation. Moreover, in some embodiments, a process for forming theisolation structures 107 a/107 b/109 a/109 b/236 a/236 b compriseperforming an etch into the semiconductor substrate 202 to form trenchesin the semiconductor substrate 202, and subsequently filling thetrenches with a dielectric material. In yet further embodiments, thefirst inner isolation structure 107 a demarcates a first device region102 a, and the second inner isolation structure 107 b demarcates asecond device region 102 b.

As illustrated by FIG. 5, a first device well 206 a and a second devicewell 206 b are formed within the semiconductor substrate 202. The firstdevice well 206 a and the second device well 206 b have a second dopingtype (e.g., n-type). In some embodiments, the second doping type isdifferent than the first doping type, and in other embodiments the firstdoping type and the second doping type are the same. The first devicewell 206 a and the second device well 206 b may, for example, be formedby ion implantation.

As illustrated by FIG. 6, a first inner ring-shaped well 106 a, a secondinner ring-shaped well 106 b, a first outer ring-shaped well 108 a, anda second outer ring-shaped well 108 b are formed within thesemiconductor substrate 202. In some embodiments, the first innerring-shaped well 106 a and the second inner ring-shaped well 106 b havethe first doping type (e.g., p-type), and the first outer ring-shapedwell 108 a and the second outer ring-shaped well 108 b have the seconddoping type (e.g., n-type). The first inner ring-shaped well 106 a, thesecond inner ring-shaped well 106 b, the first outer ring-shaped well108 a, and the second outer ring-shaped well 108 b may, for example, beformed by ion implantation. Accordingly, the first inner ring-shapedwell 106 a and the second inner ring-shaped well 106 b act as aprotection element (i.e., a guard ring) for devices disposed on the ICby collecting unwanted electrical signals that may propagate in/out ofthe first device region 102 a or the second device region 102 b,respectively, and disrupt (e.g., latch-up, unwanted activation, etc.)the function of the devices disposed on the IC. Further, the first innerring-shaped well 106 a in combination with the first outer ring-shapedwell 108 a and the second inner ring-shaped well 106 b in combinationwith the second outer ring-shaped well 108 b may provide junctionisolation that prevents unwanted current from flowing in/out the firstdevice region 102 a or the second device region 102 b, respectively, anddisrupting the function of devices disposed on the IC.

As illustrated by FIG. 7, a first gate dielectric layer 702 is formedover the semiconductor substrate 202. The first gate dielectric layer702 is disposed over both the first IC region 112 a and the second ICregion 112 b. The first gate dielectric layer 702 may, for example, beformed by thermal oxidation, chemical vapor deposition (CVD), physicalvapor deposition (PVD), sputtering, or the like.

As illustrated by FIG. 8, a first photoresist mask 802 is formed overthe first gate dielectric layer 702 by depositing a first photoresistlayer (e.g., by a spin-on process) and selectively patterning the firstphotoresist layer (e.g., by a photolithography process). In someembodiments, the first photoresist mask 802 may, for example, be formedover the first IC region 112 a but not over the second IC region 112 b,or vice versa. With the first photoresist mask 802 in place, a firstetch 804 (e.g., dry etch or wet etch) is performed into the first gatedielectric layer (702 of FIG. 7) to form a patterned first gatedielectric layer 806. In some embodiments, after the first etch 804 isperformed, the first photoresist mask 802 is stripped away.

As illustrated by FIG. 9, a second gate dielectric layer 902 is formedover the semiconductor substrate 202 and the patterned first gatedielectric layer 806. The second gate dielectric layer 902 may, forexample, be formed by thermal oxidation, CVD, PVD, sputtering, or thelike. In some embodiments, the second gate dielectric layer 902 has afirst upper surface over the first IC region 112 a and a second uppersurface over the second IC region 112 b that is a greater distance fromthe semiconductor substrate 202 than the first upper surface of thesecond gate dielectric layer 902. In further embodiments, the patternedfirst gate dielectric layer 806 may have a thickness between about 100angstrom and about 200 angstrom.

As illustrated by FIG. 10, a conductive layer 1002 is formed over thesecond gate dielectric layer 902. The conductive layer 1002 may, forexample, comprise doped polysilicon, metal, or some other conductivematerial and may, for example, be formed by CVD, PVD, sputtering, or thelike. In some embodiments, the conductive layer 1002 has a first uppersurface over the first IC region 112 a and second upper surface over thesecond IC region 112 b that is a greater distance from the semiconductorsubstrate 202 than the first upper surface of the conductive layer 1002.In further embodiments, the second gate dielectric layer 902 may have athickness between about 10 angstrom and about 20 angstrom.

Although FIG. 10 illustrates the conductive layer 1002 being formed onthe second gate dielectric layer 902, in some additional embodiments,additional gate dielectric layers may be formed prior to forming theconductive layer 1002. A second photoresist mask 1004 is formed over theconductive layer 1002 by depositing a second photoresist layer (e.g., bya spin-on process) and selectively patterning the second photoresistlayer (e.g., by a photolithography process). In some embodiments, thesecond photoresist mask 1004 is patterned such that the secondphotoresist mask 1004 covers portions of the conductive layer 1002between isolation structures 107 a/107 b/109 a/109 b/236 a/236 b. Inother embodiments, the second photoresist mask 1004 is patterned suchthat the second photoresist mask 1004 covers portions of the conductivelayer 1002 over the isolation structures 107 a/107 b/109 a/109 b/236a/236 b.

As illustrated by FIG. 11, with the second photoresist mask 1004 inplace, a second etch 1102 (e.g., dry etch or wet etch) is performed intothe conductive layer 1002, the second gate dielectric layer 902, and thepatterned first gate dielectric layer 806 to form a plurality of dishingprevention dummy gate stacks 1108, a first device gate stack 1104 a, anda second device gate stack 1104 b. The first device gate stack 1104 acomprises a first device gate electrode 222′ disposed over a firstdevice gate dielectric 220, and the second device gate stack 1104 bcomprises a second device gate electrode 228′ disposed over a seconddevice gate dielectric 226. The plurality of dishing prevention dummygate stacks 1108 each comprise a dummy gate 234′ disposed over a dummygate dielectric 232. In some embodiments, the apostrophe mark in FIGS.11-17 indicates that the first device gate electrode 222′, the seconddevice gate electrode 228′, and the dummy gate 234′ comprise anintermediate material (e.g., polysilicon) that may undergo a subsequentprocess (e.g., poly-gate replacement (RPG) high-k metal gate (HKMG)process, a fully silicided (FUSI) process, etc.) step that alters thecomposition of the intermediate material.

Depending on whether the dishing prevention dummy gate stacks 1108 aredisposed in the first IC region 112 a or the second IC region 112 b, thedummy gate dielectric 232 will have a height similar to either the firstdevice gate dielectric 220 or the second device gate dielectric 226,respectively. In some embodiments, a plurality of first device gatestacks 1104 a are formed in the first IC region 112 a and a plurality ofsecond device gate stacks 1104 b are formed in the second IC region 112b. In yet further embodiments, after the second etch 1102 is performed,the second photoresist mask 1004 is stripped away.

As illustrated by FIG. 12, in some embodiments, pairs of lightly-dopedsource/drain extensions 1202 are formed within the first IC region 112 aand the second IC region 112 b. In some embodiments, the pairs oflightly-doped source/drain extensions 1202 are formed within thesemiconductor substrate 202 by, for example, ion implantation whileusing the dishing prevention dummy gates 114, the first device gatestack 1104 a, and the second device gate stack 1104 b as a mask. Becausethe dishing prevention dummy gates 114, the first device gate stack 1104a, and the second device gate stack 1104 b may be used as a mask, thelightly-doped source/drain extensions 1202 may also be formed betweenthe dishing prevention dummy gates 114. In other embodiments, a mask isformed to prevent implantation of the lightly-doped source/drainextensions 1202 between the dishing prevention dummy gates 114. Thepairs of lightly-doped source/drain extensions 1202 comprise the firstdoping type or the second doping type, so that the source/drainextensions 1202 may have the same doping type or a different doping typethan the region (e.g., the first inner ring-shaped well 106 a) ofsemiconductor substrate 202 in which they are disposed.

As illustrated by FIG. 13, sidewall spacers 224 are formed on sidewallsof the dishing prevention dummy gate stacks 1108; the first device gatestack 1104 a; and the second device gate stack 1104 b. In someembodiments, a mask is formed to prevent formation of the sidewallspacers 224 along the dishing prevention dummy gate stacks 1108. Thesidewall spacers 224 may, for example, be silicon nitride, silicondioxide, some other dielectric, or a combination of the foregoing. Insome embodiments, a process for forming the sidewall spacers 224comprises depositing or growing a spacer layer covering and conformallylining the structure in FIG. 11. The spacer layer may, for example, bedeposited or grown by CVD, PVD, sputtering, or some other deposition orgrowth process. Further, in some embodiments, the process comprisesperforming an etch back into the spacer layer to remove horizontalsegments of the spacer layer without removing vertical segments of thespacer layer.

As illustrated by FIG. 14, pairs of source/drain regions 216 are formedin the semiconductor substrate 202 of the first IC region 112 a and thesecond IC region 112 b. In some embodiments, the pairs of source/drainregions 216 respectively adjoin pairs of the lightly-doped source/drainextensions 218 disposed between dishing prevention dummy gate stacks1108, the first device gate stack 1104 a, and the second device gatestack 1104 b. In other embodiments, a mask is formed to preventimplantation of the pairs of source/drain regions 216 between twoadjacent dishing prevention dummy gate stacks 1108. In some embodiments,the source/drain regions 216 are formed by, for example, ionimplantation.

As illustrated by FIG. 15, a ILD layer 204 is formed over thesemiconductor substrate 202. The ILD layer 204 may comprise one or morelayers of, for example, PSG, BPSG, SiO₂, or some other suitabledielectric. The ILD layer 204 may, for example, be formed by CVD, PVD,sputtering, or one other deposition or growth process, or a combinationof the foregoing.

As illustrated by FIG. 16, the ILD layer 204 is planarized by a firstplanarization process 1602. The first planarization process 1602 may,for example, be a CMP process. The first planarization process 1602reduces the height of the first device gate electrode 222′, the seconddevice gate electrode 228′, and the dummy gates 234′. Accordingly, a topsurface of the first device gate electrode 222′, the second device gateelectrode 228′, and the dummy gates 234 are substantially co-planar witha top surface of the ILD layer 204.

As illustrated by FIG. 17, a RPG HKMG process is performed. The dummygates 234′ disposed in the first IC region 112 a and the first devicegate electrode 222′ are replaced with a metal material 1702 (e.g.,aluminum, copper, tantalum, or some other conductive material) to formdummy gates 234 in the first IC region 112 a and the first device gateelectrode 222. In some embodiments, the dummy gates 234 in the first ICregion 112 a may be metal dummy gates 234 and the first device gateelectrode 222 may be a first metal device gate electrode 222.

In some embodiments, the RPG HKMG process comprises forming a thirdphotoresist mask 1704 is over the ILD layer 204 in the second IC region112 b to protect the dummy gates 234′ disposed in the second IC region112 b and the second device gate electrode 228′ from the RPG HKMGprocess. In further embodiments, the RPG HKMG process comprises a firstetch process to remove the dummy gates 234′ disposed in the first ICregion 112 a and the first device gate electrode 222′. After the dummygates 234′ disposed in the first IC region 112 a and the first devicegate electrode 222′ are removed, the metal material 1702 is deposited inthe openings in the ILD layer 204 formed by removing the dummy gates234′ disposed in the first IC region 112 a and the first device gateelectrode 222′. Thus, metal dummy gates 234 are formed in the first ICregion 112 a, and a first metal device gate electrode 222 is formed.Subsequently, the third photoresist mask 1704 is stripped away.

As illustrated by FIG. 18, in some embodiments, a FUSI process 1802 isperformed on the dummy gates 234′ disposed in the second IC region 112 band the second device gate electrode 228′ to form dummy gates 234 in thesecond IC region 112 b and the second device gate electrode 228. In someembodiments, the dummy gates 234 in the second IC region 112 b may befully silicided dummy gates 234 and the second device gate electrode 228may be a second fully silicided device gate electrode 228. In someembodiments, before the FUSI process 1802 is performed, a secondplanarization process (e.g., a CMP process) is performed to removeexcess metal material 1702 and planarize the dummy gates 234 in thefirst IC region 112 a and the first device gate electrode 222.

Moreover, in some embodiments, a fourth photoresist mask 1804 is formedover the ILD layer 204 in the first IC region 112 a to protect the dummygates 234 in the first IC region 112 a and the first device gateelectrode 222 from the FUSI process. In some embodiments, the FUSIprocess may comprise forming a transition metal layer (not shown) (e.g.,nickel) over the ILD layer 204 in the second IC region 112 b. After thetransition metal is formed, an anneal process is performed that causesthe transition metal layer (not shown) to react with the dummy gates234′ disposed in the second IC region 112 b and the second device gateelectrode 228′. Accordingly, fully silicided dummy gates 234 are formedin the second IC region 112 b, and the second fully silicided devicegate electrode 222 is formed. In some embodiments, a third planarizationprocess (e.g., a CMP process) is performed to planarize the dummy gates234 in the second IC region 112 b and the second device gate electrode228.

As illustrated by FIG. 19, a fourth planarization process 1902 isperformed on the ILD layer 204. In some embodiments, the fourthplanarization process 1902 is a CMP process suitable for planarizingfeatures of a high voltage device region (e.g., 324 of FIG. 3). Due tothe parameters of the fourth planarization process 1902, the fourthplanarization process 1902 may cause dishing to occur in the first ICregion 112 a and the second IC regions 112 b, which may result indecreased device performance. However, because the dishing preventiondummy gates 114 have been formed in the first IC region 112 a and thesecond IC region 112 b, the amount of dishing that occurs in the firstIC region 112 a and the second IC region 112 b is reduced. Moreover,because the dummy gates 234 in the first IC region 112 a and the firstdevice gate electrode 222 are formed via a RPG HKMG process and thedummy gates 234 in the second IC region 112 b and the second device gateelectrode 228 are formed via a FUSI process, the amount of dishing thatoccurs over the first IC region 112 a and the second IC region 112 b maybe further controlled and reduced. Thus, device performance may increaseand the cost of manufacturing may be reduced.

With reference to FIG. 20, a flowchart 2000 of some embodiments of themethod for forming a first IC region having dishing prevention dummygates and a second IC region having dishing prevention gate is provided.While the flowchart 2000 of FIG. 20 is illustrated and described hereinas a series of acts or events, it will be appreciated that theillustrated ordering of such acts or events is not to be interpreted ina limiting sense. For example, some acts may occur in different ordersand/or concurrently with other acts or events apart from thoseillustrated and/or described herein. Further, not all illustrated actsmay be required to implement one or more aspects or embodiments of thedescription herein, and one or more of the acts depicted herein may becarried out in one or more separate acts and/or phases.

At 2002, deep well regions and isolation structures are formed in thesemiconductor substrate. FIG. 4 illustrates a cross-sectional view ofsome embodiments corresponding to act 2002.

At 2004, device well regions are formed in a semiconductor substrate.FIG. 5 illustrates a cross-sectional view of some embodimentscorresponding to act 2004.

At 2006, inner ring-shaped wells and outer ring-shaped wells are formedin the semiconductor substrate. FIG. 6 illustrates a cross-sectionalview of some embodiments corresponding to act 2006.

At 2008, gate oxide layers and a conductive layer are formed over thesemiconductor substrate. FIGS. 7-10 illustrate a series ofcross-sectional views of some embodiments corresponding to act 2008.

At 2010, dishing prevention dummy gate stacks having dishing preventiondummy gates, a first device gate stack having a first device gateelectrode, and a second device gate stack having a second device gateelectrode are formed. FIG. 11 illustrates a cross-sectional view of someembodiments corresponding to act 2010.

At 2012, pairs of source/drain extensions are formed within thesemiconductor substrate. FIG. 12 illustrates a cross-sectional view ofsome embodiments corresponding to act 2012.

At 2014, sidewall spacers are formed along sidewalls of the dishingprevention dummy gate stacks, the first device gate stack, and thesecond device gate stack. FIG. 13 illustrates a cross-sectional view ofsome embodiments corresponding to act 2014.

At 2016, pairs of source/drain regions are formed within thesemiconductor substrate. FIG. 14 illustrates a cross-sectional view ofsome embodiments corresponding to act 2016.

At 2018, an interlayer dielectric (ILD) layer is formed over thesemiconductor substrate. FIG. 15 illustrates a cross-sectional view ofsome embodiments corresponding to act 2018.

At 2020, the ILD layer is planarized to expose the dishing preventiondummy gates, the first device gate electrode, and the second device gateelectrode. FIG. 16 illustrates a cross-sectional view of someembodiments corresponding to act 2020.

At 2022, the dishing prevention dummy gates in a first IC region arereplaced with a metal material to form metal dummy gates in the first ICregion, and the first device gate electrode is replace with the metalmaterial to from a first metal device gate electrode. FIG. 17illustrates a cross-sectional view of some embodiments corresponding toact 2022.

At 2024, the dishing prevention dummy gates in a second IC region arefully silicided to form fully silicided dummy gates in the second ICregion, and the second device gate electrode is fully silicided to forma second fully silicided device gate electrode. FIG. 18 illustrates across-sectional view of some embodiments corresponding to act 2024.

At 2026, the ILD layer is planarized. FIG. 19 illustrates across-sectional view of some embodiments corresponding to act 2026.

In view of the foregoing, some embodiments of the present applicationprovide an integrated circuit (IC) having an inner ring-shaped isolationstructure disposed in a semiconductor wafer, in which the innerring-shaped isolation structure demarcates a device region. Aninner-ring shaped well is disposed in the semiconductor and surroundsthe inner ring-shaped isolation structure. A plurality of dummy gatesare arranged over the inner ring-shaped well, in which the plurality ofdummy gates are disposed within an interlayer dielectric (ILD) layer.

Further, other embodiments of the present application provide anintegrated circuit having a first IC region and a second IC region. Thefirst IC region includes a first inner ring-shaped isolation structuredisposed in a semiconductor substrate, in which the first innerring-shaped isolation structure demarcates a first device region. Thefirst IC region further includes a first inner-ring shaped well that isdisposed in the semiconductor substrate and surrounds the first innerring-shaped isolation structure. In addition, the first IC regionincludes a first dishing prevention dummy gate arranged over the firstinner ring-shaped well, in which the first dishing prevention dummy gateis disposed in a dielectric layer. The second IC region includes asecond inner ring-shaped isolation structure disposed in thesemiconductor substrate, in which the second inner ring-shaped isolationstructure demarcates a second device region. The second IC regionfurther includes a second inner-ring shaped well that is disposed in thesemiconductor substrate and surrounds the second inner ring-shapedisolation structure. In addition, the second IC region includes a seconddishing prevention dummy gates arranged over the second innerring-shaped well, in which the second dishing prevention dummy gate isdisposed in the dielectric layer.

Further yet, other embodiments of the present application provide amethod for forming an integrated circuit (IC). The method includesforming a first inner ring-shaped isolation structure in a semiconductorsubstrate, in which the first inner ring-shaped isolation structuredemarcates a first device region. A first inner-ring shaped well isformed in the semiconductor substrate and surrounds the first innerring-shaped isolation structure. A second inner ring-shaped isolationstructure that is laterally spaced from the first inner ring-shapedisolation structure is formed in the semiconductor substrate, in whichthe second inner ring-shaped isolation structure demarcates a seconddevice region. A second inner ring-shaped well is formed in thesemiconductor substrate and surrounds the second inner ring-shapedisolation structure. A first dummy gate is formed over the first innerring-shaped well. A first device gate electrode is formed over the firstdevice region. A second dummy gate is formed over the second innerring-shaped well. A second device gate electrode is formed over thesecond device region. The first dummy gate and the first device gateelectrode are removed and replaced with a conductive material. Thesecond dummy gate and the second device gate electrode are reacted witha transition metal. A chemical-mechanical planarization (CMP) process isperformed on the IC.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. An integrated circuit (IC) comprising: an innerisolation structure disposed in a semiconductor substrate, wherein aninner perimeter of the inner isolation structure demarcates a deviceregion; an inner ring-shaped well disposed in the semiconductorsubstrate and laterally surrounding the inner isolation structure; anouter isolation structure disposed in the semiconductor substrate andlaterally surrounding both the inner ring-shaped well and the innerisolation structure; and a plurality of dishing prevention dummy gatesarranged over both the inner ring-shaped well and the outer isolationstructure, wherein a third dishing prevention dummy gate of theplurality of dishing prevention dummy gates comprises a third dummy gatedielectric disposed on the outer isolation structure, and whereinsidewalls of the third dummy gate dielectric are disposed within aninner perimeter of the outer isolation structure and an outer perimeterof the outer isolation structure.
 2. The IC of claim 1, furthercomprising: an outer ring-shaped well disposed in the semiconductorsubstrate and laterally surrounding the outer isolation structure,wherein the outer ring-shaped well and the inner ring-shaped well haveopposite doping types.
 3. The IC of claim 1, wherein a thickness of theinner ring-shaped well is less than a shortest distance between theinner perimeter of the inner isolation structure and the outer perimeterof the outer isolation structure.
 4. The IC of claim 1, wherein: a firstdishing prevention dummy gate of the plurality of dishing preventiondummy gates comprises a first dummy gate dielectric disposed on theinner isolation structure; and sidewalls of the first dummy gatedielectric are disposed within the inner perimeter of the innerisolation structure and an outer perimeter of the inner isolationstructure.
 5. The IC of claim 1, wherein: a second dishing preventiondummy gate of the plurality of dishing prevention dummy gates comprisesa second dummy gate dielectric disposed on the inner ring-shaped well;and sidewalls of the second dummy gate dielectric are disposed within aninner perimeter of the inner ring-shaped well and an outer perimeter ofthe inner ring-shaped well.
 6. The IC of claim 1, wherein the innerring-shaped well contacts both an outer perimeter of the inner isolationstructure and the inner perimeter of the outer isolation structure. 7.The IC of claim 6, wherein: a first dishing prevention dummy gate of theplurality of dishing prevention dummy gates comprises a first dummy gatedielectric disposed on the inner isolation structure; and a seconddishing prevention dummy gate of the plurality of dishing preventiondummy gates comprises a second dummy gate dielectric disposed on theinner ring-shaped well.
 8. The IC of claim 7, further comprising: anouter ring-shaped well disposed in the semiconductor substrate andlaterally surrounding the outer isolation structure, wherein: the outerring-shaped well and the inner ring-shaped well have opposite dopingtypes; the outer ring-shaped well contacts the outer perimeter of theouter isolation structure; and a fourth dishing prevention dummy gate ofthe plurality of dishing prevention dummy gates comprises a fourth dummygate dielectric disposed on the outer ring-shaped well.
 9. An integratedcircuit (IC) comprising: a first ring-shaped isolation structuredisposed in a semiconductor substrate, wherein the first ring-shapedisolation structure demarcates a first device region; a secondring-shaped isolation structure disposed in the semiconductor substrateand spaced from the first ring-shaped isolation structure, wherein thesecond ring-shaped isolation structure demarcates a second deviceregion; a first dummy gate disposed over both the first ring-shapedisolation structure and the second ring-shaped isolation structure; anda second dummy gate disposed over both the first ring-shaped isolationstructure and the second ring-shaped isolation structure, wherein a topsurface of the first dummy gate has a first area and a top surface ofthe second dummy gate has a second area different than the first area.10. The IC of claim 9, further comprising: an outer ring-shaped welldisposed in the semiconductor substrate, wherein the outer ring-shapedwell extends between the first ring-shaped isolation structure and thesecond ring-shaped isolation structure and extends laterally around thefirst ring-shaped isolation structure and laterally around the secondring-shaped isolation structure.
 11. The IC of claim 9, wherein: thefirst dummy gate is one of a plurality of third dummy gates disposedover the first ring-shaped isolation structure and in a first IC region;the second dummy gate is one of a plurality of fourth dummy gatesdisposed over the second ring-shaped isolation structure and in a secondIC region; the first IC region and the second IC region have a samearea; and a density of the plurality of third dummy gates is greater inthe first IC region than a density of the plurality of fourth dummygates in the second IC region.
 12. The IC of claim 9, furthercomprising: a first semiconductor device disposed in the first deviceregion and having a first gate electrode, wherein a top surface of thefirst gate electrode has a third area that is substantially the same asthe first area.
 13. The IC of claim 12, further comprising: a secondsemiconductor device disposed in the second device region and having asecond gate electrode, wherein a top surface of the second gateelectrode has a fourth area that is substantially the same as the secondarea.
 14. The IC of claim 13, further comprising: a fifth dummy gatedisposed over both the first ring-shaped isolation structure and thesecond ring-shaped isolation structure and disposed between the firstdummy gate and the second dummy gate, wherein a top surface of the fifthdummy gate has a fifth area different than both the first area and thesecond area.
 15. An integrated circuit (IC) comprising: a first innerisolation structure disposed in a semiconductor substrate, wherein theinner isolation structure demarcates a first device region; a secondinner isolation structure disposed in the semiconductor substrate andspaced from the first inner isolation structure, wherein the secondinner isolation structure demarcates a second device region; an outerring-shaped well disposed in the semiconductor substrate and between thefirst inner isolation structure and the second inner isolationstructure; a first dishing prevention dummy gate disposed over both thefirst inner isolation structure and the outer ring-shaped well, whereinthe first dishing prevention dummy gate comprises a first dummy gatehaving a first conductive material; and a second dishing preventiondummy gate disposed over both the second inner isolation structure andthe outer ring-shaped well, wherein both the first dishing preventiondummy gate and the second dishing prevention dummy gate are disposedbetween the first device region and the second device region, andwherein the second dishing prevention dummy gate comprises a seconddummy gate having a second conductive material different than the firstconductive material.
 16. The IC of claim 15, further comprising: a thirddishing prevention dummy gate disposed over both the inner isolationstructure and the second inner isolation structure and disposed betweenthe first dishing prevention dummy gate and the second dishingprevention dummy gate, wherein a top surface of the third dishingprevention dummy gate has a first area, a top surface of the firstdishing prevention dummy gate has a second area, and a top surface ofthe second dishing prevention dummy gate has a third area, and whereinthe first area is different than both the second area and the thirdarea.
 17. The IC of claim 15, further comprising: a first semiconductordevice disposed in the first device region, wherein the firstsemiconductor device comprises a first gate electrode having the firstconductive material; and a second semiconductor device disposed in thesecond device region, wherein the second semiconductor device comprisesa second gate electrode having the second conductive material.
 18. TheIC of claim 15, wherein: the first dishing prevention dummy gatecomprises a dummy gate dielectric disposed on the second inner isolationstructure; and sidewalls of the dummy gate dielectric are disposedwithin an inner perimeter of the second inner isolation structure and anouter perimeter of the second inner isolation structure.
 19. The IC ofclaim 15, wherein: the first dishing prevention dummy gate comprises adummy gate dielectric disposed on the outer ring-shaped well; andsidewalls of the dummy gate dielectric are disposed within an innerperimeter of the outer ring-shaped well and an outer perimeter of theouter ring-shaped well.
 20. The IC of claim 9, further comprising: afirst dummy gate dielectric disposed between the first dummy gate andthe semiconductor substrate; and a second dummy gate dielectric disposedbetween the second dummy gate and the semiconductor substrate.